I/O Tests (Device Fundamentals)
The Device Fundamentals I/O tests perform basic I/O testing on the specified devices.
I/O tests
| Test | Description |
|---|---|
|
This test performs basic I/O testing on devices. Test binary: Devfund_Device_IO.wsc Test method: DeviceIO Parameters: - see Device Fundamentals Test Parameters DQ TestCycles IOPeriod IOType | |
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This test performs simple I/O testing on devices in a separate process and terminates the I/O process after the specified I/O period and test cycles. Test binary: Devfund_SimpleIoStress_TermIoProc.wsc Test method: SimpleIOStress_TermIoProc Parameters: - see Device Fundamentals Test Parameters DQ TestCycles IOPeriod |
Related topics
- How to How to test a driver at runtime using Visual Studio
- How to select and configure the Device Fundamentals tests
- Device Fundamentals Tests
- Device Fundamentals Test Parameters
- Provided WDTF Simple I/O plug-ins
- How to test a driver at runtime from a Command Prompt
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Build date: 2/13/2014
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